Many performances for micronization, N2 Purge, 200mm CST

Features
Accommodating device miniaturization |
Unique airflow analysis to prevent particles. N2 purge on load port. |
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Accommodating various carriers | Accommodating FOUP, MAC and AUTO-FOSB. |
High reliability |
High reliability achieved by accumulated technology of 300mm load port. (MCBF:1,000,000cycle)
Detect double or crossed wafers by high precision mapping. Latch over-rotation to close carriers completely. |
Easy Maintenance | No batteries are used, and maintenance is much easier |